News & Event

  • Feb. 22, 2016
    Events
    Taiyo Nippon Sanso is planning a presentation during the poster session at the 2016 MRS Spring Meeting & Exhibit from March 28 to April 1 at the Phoenix Convention Center.
    The topic will be “Variation of Vertical Direction Breakdown Voltage of the AlGaN/GaN HEMTs on AlN/Si Template Substrate as a Function of the Growth Temperature of the Initial Al Layer.” 
  • Feb. 22, 2016
    Events
    Taiyo Nippon Sanso is planning a presentation during the ISPlasma symposium from March 6 to 10, 2016 at Nagoya University.
    The topic will be “Breakdown electric field of each layer in AlGaN/GaN high-electron-mobility transistors on Si substrates.”
  • Feb. 22, 2016
    Events
  • Oct. 06, 2015
    Events
    Taiyo Nippon Sanso is planning a presentation during the oral cession IEICE Technical Committee from November 26 to 27, 2015 at Osaka City University Media center in Osaka, Japan.
    Topic will be "Dependence of the initial AlN layer of the vertical direction leakage current of the AlGaN/GaN HEMT structure on Silicon substrate" 
  • Oct. 06, 2015
    Events
    Taiyo Nippon Sanso is planning a presentation at The 6th International Symposium on Growth of Ⅲ-Nitrides from November 8 to 13, 2015 at Act City Hamamatsu in Hamamatsu, Japan.
    Topic of the poster session will be "Si-doped Al0.6Ga0.4N with low carbon concentration at high growth rate using high-speed-flow MOVPE reactor"
    Topic of the keynote lecture will be "Opportunities and Challenges to GaN MOCVD for Electron Devices" 
  • Oct. 06, 2015
    Events
    Taiyo Nippon Sanso is planning a presentation during the oral session at The 9th International Workshop on Bulk Nitride Semiconductors from November 2 to 6, 2015 at Oak Valley in Wonju, South Korea.
    Topic will be "Low C and Si residual concentration of GaN grown on GaN Substrates by MOCVD" 
  • Sep. 01, 2015
    Events
  • Aug. 23, 2015
    Technical Update
    Correlation of the initial AlN layer and vertical direction current leakage of AlGaN/GaN high-electron-mobility transistors (HEMTs) on Si substances
    Advance copy for the 11th Topical Workshop on Heterostructure Microelectronics (Poster Session)
  • Aug. 04, 2015
    Events
    Taiyo Nippon Sanso plans to have a booth at the Workshop on Ultra-Precision Processing for Wide Bandgap Semiconductors (WUPP) from August 20 to 21, 2015 at Hilton Fukuoka Sea Hawk in Fukuoka, Japan.
  • Aug. 04, 2015
    Events
    Taiyo Nippon Sanso plans to have a booth at the 11th Topical Workshop on Heterostructure Microelectronics (TWHM) from August 23 to 26, 2015 at Hida Hotel Plaza in Takayama, Japan.
    It is also planning to participate in the poster session on the topic of "Correlation of initial AlN layer and vertical direction current leakage of AlGaN/GaN high-electron-mobility transistors (HEMTs) on Si substances". 
  • Aug. 04, 2015
    Events
    Taiyo Nippon Sanso plans to have a booth at the 11th International Conference on Nitride Semiconductors (ICNS-11) from August 30 to September 4, 2015 at the Beijing International Convention Center in Beijing, China.
  • Feb. 26, 2015
    Events
    Taiyo Nippon Sanso plans to have a booth at LED Taiwan 2015 from March 25 to 28, 2015 at the TWTC Nangang Exhibit Hall in Taipei, Taiwan.
  • Dec. 15, 2014
    News
    TAIYO NIPPON SANSO Corporation's MOCVD system was mentioned in THE GAS REVIEW No. 396 (November 26, 2014 issue) article about the Nobel Prize in Physics.
  • Nov. 04, 2014
    News
  • Oct. 09, 2014
    News
    Sandia National Laboratories Orders Commercial Grade GaN-MOCVD System from Matheson/Taiyo Nippon Sanso
  • Mar. 25, 2025
    Technical Update
    In Situ Center Wavelength Control of AlInN/GaN Distributed Bragg Reflectors with In Situ Reflectivity Spectra Measurements
  • Mar. 19, 2025
    Technical Update
    Development of RGB monolithic GaInN-based μLED arrays with tunnel junctions
  • Nov. 01, 2024
    Technical Update
    AlN/AlGaN heterojunction field-effect transistors with a high-AlN-mole-fraction Al0.72Ga0.28N channel grown on a single-crystal AlN substrate by metalorganic chemical vapor deposition
  • Apr. 24, 2024
    Technical Update
    Current collapse suppression in AlGaInN/GaN HEMTs with thin unintentionally doped GaN channel and AlN back barrier grown on single-crystal AlN substrate
  • Aug. 17, 2023
    Technical Update
    RGB monolithic GaInN-based μLED arrays connected via tunnel junctions
  • Jan. 13, 2023
    Technical Update
    DC and Pulse I–V Characteristics of Strain-Engineered AlGaInN/GaN HEMTs fabricated on Single-Crystal AlN Substrate
  • Nov. 26, 2020
    Technical Update
    High-quality AlInN/GaN distributed Bragg reflectors grown by metalorganic vapor phase epitaxy
  • Feb. 01, 2017
    Technical Update
    Characteristics of AlN Layer on 4 inch Sapphire Substrate by High Temperature Annealing in Nitrogen Atmosphere
  • Jan. 05, 2017
    Technical Update
    Influence of the Al content of the AlGaN buffer layer in AlGaN/GaN high-electron-mobility transistor structures on a Si substrate
  • Oct. 07, 2016
    Technical Update
    Impact of crystal quality of AlN nucleation layer on the vertical direction breakdown voltage of AlGaN/GaN high-electron-mobility transistor structures on Si
  • Oct. 07, 2016
    Technical Update
    Regrowth of High-Al-content AlGaN and AlN on High-quality AlN Template Fabricated by Annealing at 1700 ℃ under Nitrogen Ambient
  • Aug. 30, 2016
    Technical Update
    Study of carbon concentration in GaN grown by metalorganic chemical vapor deposition
  • Aug. 28, 2016
    Technical Update
    High quality Al0.6Ga0.4N and AlN growth on AlN template with a high temperature annealing in N2 ambience
  • Aug. 28, 2016
    Technical Update
    Challenge and Opportunity of high-flow rate MOCVD tool for UV-LED Application
  • Jul. 10, 2016
    Technical Update
    Characterization of AlN and Mg-doped AlxGa1-xN(x>0.2) Grown by Using Horizontal High-flow-rate MOVPE System 2016 ICMOVPE