News & Event

  • Jul. 02, 2014
    Events
    Taiyo Nippon Sanso plans to have a booth at IWN 2014 (International Workshop on Nitride Semiconductors 2014) from August 24 to 29, 2014 at the Centennial Hall in Wroclaw, Poland.
  • Jul. 02, 2014
    Events
  • Apr. 18, 2014
    Events
    Taiyo Nippon Sanso will be holding a booth at the 5th International Symposium on Growth of Ⅲ-Nitrides (ISGN-5) at the Westin Hotel, Peachtree Plaza (Atlanta, Georgia) from May 18 to 22, 2014.
  • Apr. 16, 2014
    News
    TNSC Signs Technical MOCVD Agreement With ITRI — LEDinside
  • Apr. 16, 2014
    News
    ITRI and TNSC Unite to Promote UVA LED Production on GaN Substrate — LEDinside
  • Apr. 16, 2014
    News
    ITRI and TNSC unite to enhance GaN LED growth — Compound Semiconductor
  • Apr. 16, 2014
    News
    TNSC Announces Technical Agreement with ITRI
    TNSC, a manufacturer of metal organic chemical vapor deposition (MOCVD) systems, has signed a technical agreement with Taiwan-based ITRI, which is known for its world-class technologies for optoelectronic devices. The objective of the agreement is to develop UVA LEDs on GaN substrates with TNSC AP (atmospheric pressure) MOCVD in order to demonstrate the potential of AP-MOCVD, which is a proprietary advanced technology of Taiyo Nippon Sanso. ITRI recognizes that the TNSC AP-MOCVD system has numerous advantages in growing UVA materials, including the high growth rate of low carbon GaN, high luminescence efficiency of low indium content InGaN and GaN, constant pressure and continuous growth of InGaN and AlGaN interface and high doping efficiency of AlGaN thanks to high quality. Potentially, ITRI and TNSC can develop a higher performance UVA LED on a native GaN substrate at a reasonable price than on a conventional sapphire substrate, because it can inject more current into an LED on a native GaN substrate due to low dislocation density and easy current spreading. The near-ideal point light source will improve the utilization efficiency of UV light with simple optics. ITRI and TNSC hope that the partnership will contribute to a new UVA LED technology standard as well as GaN on GaN application promotion.
  • Apr. 02, 2014
    Technical Update
    Normally-OFF Al2O3/AlGaN/GaN MOS-HEMT on 8 in. Si with Low Leakage Current and High Breakdown Voltage (825 V) Appl. Phys. Express 7, 041003 (2014)
  • Mar. 20, 2014
    Technical Update
    Industry MOCVD: III-N film growth Compound Semiconductor-Volume 20, Number 2-March 20
  • Mar. 18, 2014
    Events
    Taiyo Nippon Sanso will have a booth at "LED Taiwan 2014," to be held at TWTC Nangang Exhibit Hall, Taiwan from March 20 to 23, 2014.
  • Mar. 16, 2014
    News
    Article about TNSC's MOCVD published in Compound Semiconductor magazine
    Faster, better III-N film growth (Page 38) — Compound Semiconductor
  • Oct. 23, 2013
    Technical Update
    High growth rates of AlN and AlGaN on 8" silicon wafer using metal-organic vapor phase epitaxy reactor
  • Aug. 01, 2013
    Events
    Taiyo Nippon Sanso plans to have a booth at SEMICON Taiwan 2013 from September 4 to 6, 2013 at TWTC Nangang Exhibition Hall, Taiwan.
  • Aug. 01, 2013
    Events
    Taiyo Nippon Sanso is planning both a booth and a presentation on the epi-results of its MOCVD systems during the poster session at ICNS-10 (10th International Conference on Nitride Semiconductors) from August 25 to 30, 2013 at Gaylord National Hotel and Convention Center, Washington.
    TNSC poster session presentation: August 28, 2013 
  • Aug. 01, 2013
    Events
    Taiyo Nippon Sanso plans to have a booth at TWHM 2013 (10th Topical Workshop on Heterostructure Microelectronics) from September 2 to 5, 2013 at Hakodate Kokusai Hotel.
  • Mar. 25, 2025
    Technical Update
    In Situ Center Wavelength Control of AlInN/GaN Distributed Bragg Reflectors with In Situ Reflectivity Spectra Measurements
  • Mar. 19, 2025
    Technical Update
    Development of RGB monolithic GaInN-based μLED arrays with tunnel junctions
  • Nov. 01, 2024
    Technical Update
    AlN/AlGaN heterojunction field-effect transistors with a high-AlN-mole-fraction Al0.72Ga0.28N channel grown on a single-crystal AlN substrate by metalorganic chemical vapor deposition
  • Apr. 24, 2024
    Technical Update
    Current collapse suppression in AlGaInN/GaN HEMTs with thin unintentionally doped GaN channel and AlN back barrier grown on single-crystal AlN substrate
  • Aug. 17, 2023
    Technical Update
    RGB monolithic GaInN-based μLED arrays connected via tunnel junctions
  • Jan. 13, 2023
    Technical Update
    DC and Pulse I–V Characteristics of Strain-Engineered AlGaInN/GaN HEMTs fabricated on Single-Crystal AlN Substrate
  • Nov. 26, 2020
    Technical Update
    High-quality AlInN/GaN distributed Bragg reflectors grown by metalorganic vapor phase epitaxy
  • Feb. 01, 2017
    Technical Update
    Characteristics of AlN Layer on 4 inch Sapphire Substrate by High Temperature Annealing in Nitrogen Atmosphere
  • Jan. 05, 2017
    Technical Update
    Influence of the Al content of the AlGaN buffer layer in AlGaN/GaN high-electron-mobility transistor structures on a Si substrate
  • Oct. 07, 2016
    Technical Update
    Impact of crystal quality of AlN nucleation layer on the vertical direction breakdown voltage of AlGaN/GaN high-electron-mobility transistor structures on Si
  • Oct. 07, 2016
    Technical Update
    Regrowth of High-Al-content AlGaN and AlN on High-quality AlN Template Fabricated by Annealing at 1700 ℃ under Nitrogen Ambient
  • Aug. 30, 2016
    Technical Update
    Study of carbon concentration in GaN grown by metalorganic chemical vapor deposition
  • Aug. 28, 2016
    Technical Update
    High quality Al0.6Ga0.4N and AlN growth on AlN template with a high temperature annealing in N2 ambience
  • Aug. 28, 2016
    Technical Update
    Challenge and Opportunity of high-flow rate MOCVD tool for UV-LED Application
  • Jul. 10, 2016
    Technical Update
    Characterization of AlN and Mg-doped AlxGa1-xN(x>0.2) Grown by Using Horizontal High-flow-rate MOVPE System 2016 ICMOVPE