News

  • Dec. 01, 2006
    Technical Paper
    Ex situ dry cleaning of reactor component of nitride metal organic chemical vapor deposition using chlorinated gases "Journal of Crystal Growth 298 (2007) 433-436"
  • Nov. 01, 2006
    Technical Paper
     GaN growth on 150-mm-diameter (111) Si substrates "Journal of Crystal Growth 298 (2007) 198-201"
  • Mar. 01, 2006
    Technical Paper
    Growth and electron transport studies of InAlN/GaN two-dimensional electron gas Advance copy for the 53rd Spring Meeting (2006) of the Japan Society of Applied Physics and Related Societies
  • May 01, 2005
    Technical Paper
    Quaternary InAlGaN-based high-efficiency ultraviolet light-emitting diodes J. Appl. Phys. 97, 091101 (2005)
  • Jan. 01, 2005
    Technical Paper
    Realization of High Internal Quantum Efficiency over 35% in 330 nm-band deep-UV using Quaternary InAlGaN Quantum Well ICNS-6 Late News
  • Sep. 01, 2004
    Technical Paper
    Effects of growth pressure on AlGaNand Mg-doped GaN grown using multiwafer metal organic vapor phase epitaxy system
  • Aug. 01, 2004
    Technical Paper
    Growth mechanism of atmospheric pressure MOVPE of GaN and its alloys: gas phase chemistry and its impact on reactor design
  • Feb. 01, 2002
    Technical Paper
    Effect of Growth Parameter on InGaN/GaN MQW Structures Grown with Laminar-Three Flow Multi Wafer AP-MOVPE
  • Jan. 01, 2002
    Technical Paper
    Influent of Ambient Hydrogen Gas on Crystalline Quality in GaN
  • Feb. 01, 2017
    Technical Paper
    Characteristics of AlN Layer on 4 inch Sapphire Substrate by High Temperature Annealing in Nitrogen Atmosphere
  • Jan. 05, 2017
    Technical Paper
    Influence of the Al content of the AlGaN buffer layer in AlGaN/GaN high-electron-mobility transistor structures on a Si substrate
  • Oct. 07, 2016
    Technical Paper
    Impact of crystal quality of AlN nucleation layer on the vertical direction breakdown voltage of AlGaN/GaN high-electron-mobility transistor structures on Si
  • Oct. 07, 2016
    Technical Paper
    Regrowth of High-Al-content AlGaN and AlN on High-quality AlN Template Fabricated by Annealing at 1700 ℃ under Nitrogen Ambient
  • Aug. 30, 2016
    Technical Paper
    Study of carbon concentration in GaN grown by metalorganic chemical vapor deposition
  • Aug. 28, 2016
    Technical Paper
    High quality Al0.6Ga0.4N and AlN growth on AlN template with a high temperature annealing in N2 ambience
  • Aug. 28, 2016
    Technical Paper
    Challenge and Opportunity of high-flow rate MOCVD tool for UV-LED Application
  • Jul. 10, 2016
    Technical Paper
    Characterization of AlN and Mg-doped AlxGa1-xN(x>0.2) Grown by Using Horizontal High-flow-rate MOVPE System 2016 ICMOVPE
  • Jun. 26, 2016
    Technical Paper
    Improvement of Crystalline Quality of AlN and High-Al-content AlGaN at High Growth Rate Using Horizontal High-flow-rate MOVPE System CSW 2016
  • Jun. 26, 2016
    Technical Paper
    Relationship between Al content of AlGaN buffer layer on top of initial AlN nucleation layer on Si and vertical leakage current of AlGaN/GaN highelectron-mobility transistor structures CSW 2016
  • Jun. 17, 2016
    Technical Paper
    GROWTH OF N-TYPE AlxGa1-xN (x>0.5) WITH LOW ELECTRIC RESISTIVITY AT HIGH V/III RATIO IWUMD 2016
  • Mar. 19, 2016
    Technical Paper
    Effect of the formation temperature of the AlN/Si interface on the vertical-direction breakdown voltages of AlGaN/GaN HEMTs on Si substrates MRS Advances
  • Mar. 19, 2016
    Technical Paper
    Variation of vertical direction breakdown voltage of the AlGaN/GaN HEMTs on AlN/Si template substrate as a function of growth temperature of initial Al layer MRS2016 spring meeting (Poster Session)
  • Mar. 06, 2016
    Technical Paper
    Breakdown electric field of each layer in AlGaN/GaN high-electron-mobility transistors on Si substrates Isplasma 2016
  • Aug. 23, 2015
    Technical Paper
    Correlation of the initial AlN layer and vertical direction current leakage of AlGaN/GaN high-electron-mobility transistors (HEMTs) on Si substances
    Advance copy for the 11th Topical Workshop on Heterostructure Microelectronics (Poster Session)